State-of-the-art analysis and measurement technology for the physico-chemical characterisation of nanomaterials is available at BAM. Testing procedures for specific tasks are developed and validated in are labs. Many testing procedures are ISO-certified. Most of our characterisation and testing work is carried out in accredited laboratories.
More and detailed technical information on our measuring techniques, resolution, accuracy, practical requirements and application areas beyond nanotechnology.The following measurement technology is available:
More and detailed technical information on our measuring techniques, resolution, accuracy, practical requirements and application areas beyond nanotechnology.The following measurement technology is available:
- X-ray analysis
- Electron microscopy
- Scanning probe microscopy
- Auger-electron microscopy
- Optical techniques
- Mass spectrometry
- Dielectric spectrometry
- Characterisation of powders and dispersions
- Indentation testing
- Particle counting
- Elemental trace analysis
X-ray analysis
Measuring techniques:
Measuring techniques:
- XANES/NEXAFS (X-ray Absorption Near Edge Structure/Near Edge X-ray Absorption Fine Structure)
- SAXS (Small Angle X-ray Scattering)
- XRD (X-ray Diffraction)
- XRF (X-ray Fluorescence Spectroscopy)
- XPS/ESCA (X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis)
- EDX (Energy Dispersive X-ray Spectroscopy)
- WDX (Wavelength Dispersive X-ray Spectroscopy)
- µXRF (Micro X-ray Fluorescence)
- TXRF (Total Reflection XRF)
- GIXRF (Grazing Incidence XRF)